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 General specifications:
 Test current (into short circuit): ±12mA (typical)
 Test voltage (into open circuit): ±12V (typical)
 
 Component Support
 
 Bipolar transistors (NPN/PNP inc Silicon/Germanium)Darlington transistors (NPN/PNP)Enhancement mode MOSFETs (N-Ch and P-Ch)Depletion mode MOSFETs (N-Ch and P-Ch)Junction FETs (N-Ch and P-Ch). Both symmetrical and asymmetrical types.Enhancement IGBTs (N-Ch and P-Ch).Diodes and diode networks (2 and 3 lead types).Zener diodes (up to about 9V).Voltage regulators (up to about 8V).LEDs and bi-colour LEDs (2 lead and 3 lead types).Low power sensitive Triavs and Thyristors (<10ma trigger="" and="" hold="" li="">
 Measurements
 
 BJT current gain (hFE).BJT base emitter voltage (Vbe).BJT collector leakage current.MOSFET on and off gate threshold voltages.MOSFET transconductance.JFET pinch-off voltage.JFET transconductance.JFET IDSS (drain current for Vgs=0)IGBT on and off gate threshold voltages.IGBT transconductance.Voltage regulator output voltage.Voltage regulator quiescent current consumption.Voltage regulstor drop-out voltage.Zener voltage.Diode forward voltage drop.
 PC Communications
 
 Micro USB socket (supplied with micro USB to standard USB cable).Supports Windows® XP, Vista, 7, 8 and 10 (32 bit and 64 bit versions).Does not currently support Linux and Mac directly.
 
 FAQs
 DownloadsSoftware installation guide (EN)
 Latest software and firmware package
 User Guide (EN)
 Benutzerhandbuch (DE)
 Data Sheet (EN)
 
 
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